A Surface Roughness Evaluation Method of Optic Waveguide Manufacture Based on Microscope Image Analysis

doi:10.3969/j.issn,1674-5558.2015.01.012

LIU Hao-ting, HUANG Tao, WANG Fei-qin, YU Wen-peng, YU Qi

Navigation and Control ›› 2015, Vol. 14 ›› Issue (1) : 65-69.

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Navigation and Control ›› 2015, Vol. 14 ›› Issue (1) : 65-69. DOI: 10.3969/j.issn,1674-5558.2015.01.012

A Surface Roughness Evaluation Method of Optic Waveguide Manufacture Based on Microscope Image Analysis

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2015, 14(1): 65-69 https://doi.org/10.3969/j.issn,1674-5558.2015.01.012

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Received	Published
2014-09-10	2015-02-05
Issue Date
2020-05-28

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